Discussion
Assertion (A): A scanning electron microscope is often fitted with an X-ray detector.
Reason (R): It allows the composition of a particular particle to be measured while it is being viewed.
Answer: C
Correct answer: Both A and R are true, and R is the correct explanation of A
Both are true and the reason gives the purpose. The electron beam excites characteristic X-rays from whatever it strikes, and an energy dispersive detector analyses them, so the operator can point at one particle in the image and ask what it is made of. That combination of morphology and composition on the same spot is what makes the technique so useful for identifying contaminants and inclusions.
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