Discussion
Match List I with List II :
| List I | List II |
|---|---|
| (a) Si + O2 | (1) Wet oxidation |
| (b) Si + 2H2O | (2) Operates for only few seconds at high temperatures |
| (c) Ion implantation | (3) Dry oxidation |
| (d) Rapid thermal processing | (4) Projected range |
Codes : (a) (b) (c) (d)
Answer: C
The correct code is (3) (1) (4) (2).
- (a) Si + O2 → SiO2 uses dry oxygen: dry oxidation.
- (b) Si + 2H2O → SiO2 + 2H2 uses steam: wet oxidation.
- (c) In ion implantation the mean depth the ions reach is called the projected range.
- (d) Rapid thermal processing heats the wafer to high temperature for only a few seconds.
Options B and D swap dry and wet oxidation, and option A gives ion implantation the few-seconds heating that belongs to rapid thermal processing.
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