Discussion

Match the characterization techniques in Column I with the options in Column II

Column I	Column II
P. Scanning tunneling microscopy	1. No vacuum required
Q. Scanning electron microscopy	2. Backscattered electrons
R. Transmission electron microscopy	3. Photoelectrons
S. Atomic force microscopy	4. Atomically sharp tip
	5. Sub-Angstrom resolution

Answer: A

The match is P-4, Q-2, R-5, S-1.

Scanning tunnelling microscopy relies on an atomically sharp conducting tip, through whose apex the tunnelling current flows.
Scanning electron microscopy images with secondary and backscattered electrons.
Transmission electron microscopy, especially aberration-corrected high-resolution TEM, reaches sub-angstrom resolution.
Atomic force microscopy senses forces on a cantilever tip and works in air or liquid, with no vacuum required.

Photoelectrons belong to X-ray photoelectron spectroscopy, which is not in the list, so any option using item 3 is wrong.

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